![]() ![]() Samples may be tested nondestructively.Large and small samples of polycrystalline materials down to fractions of grams can be analyzed using the diffractometer systems. The characteristic lattice spacings and intensities are used to search through nearly a half-million JCPDS data sets for known phases. Qualitative phase analysis software has been written for data collection and preprocessing to strip background and detect diffraction peaks using first and second derivative algorithms.Ĭommercial search/match software is used for searching the full Joint Committee for Powder Diffraction Standards (JCPDS) data file system, including organic, inorganic, mineral, and alloy systems. Lambda Technologies provides X-ray diffraction qualitative phase analysis using diffractometer techniques. From the knowledge of the crystalline structure, the temperatures, pressures, and other aspects of formation can often be deduced. The molecular components and crystalline structures are determined, allowing individual components of a mixture, such as an oxide and sulfide, to be identified. While elemental analysis obtained by spectroscopy or wet chemistry can identify the elemental constituents of a component or mixture, XRD provides far more information. The diffracted peak positions and intensities from a particular material phase serve as a fingerprint that can be compared to a database of reference patterns to identify a phase or phases of solids, powders, thin films, or suspensions. Each phase of a crystalline material will produce a unique diffraction pattern. Qualitative Phase Analysis provides material information gleaned from an X-ray diffraction (XRD) pattern and a pattern plot of diffracted X-ray intensity vs. What is X-Ray Diffraction Qualitative Phase Analysis? ![]()
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